Reliability test
The quality and reliability of a product is largely determined by efforts at the design phase. When designing, based on the reliability data we have accumulated thus far, we design for quality and reliability that takes into account the customer's use conditions, etc., and confirm the validity of the design through reliability testing.
Our reliability testing is conducted based on JEITA ED 4701 or MIL-STD-883, and the test results are continuously accumulated as data and relayed back to the design division and manufacturing process division to enhance reliability.
Our standard reliability test criteria are shown in the table below.
Please contact us separately about reliability test criteria for individual products.
Reliability test requirements (standard)
| No. | TEST ITEM | TEST METHOD | CRITERION | ||
|---|---|---|---|---|---|
| REFERENCE STANDARD | CONDITION | TEST TIME | |||
| 1 | High Temperature Storage | JEITA EIAJ ED-4701/201 MIL-STD-883 1008.2 |
Ta=125℃ | 1000h | It is due to the electric characteristic standard. |
| 2 | High Temperature Operating Life | JEITA EIAJ ED-4701/101 MIL-STD-883 1005.8 |
Ta=125℃ VDD=MAX |
1000h | It is due to the electric characteristic standard. |
| 3 | Temperature Humidity Bias | JEITA EIAJ ED-4701/102 MIL-STD-883 1005.2 |
Ta=85℃ RH=85% VDD=MAX*1 |
1000h | It is due to the electric characteristic standard. |
| 4 | Pressure Cooker | JEITA EIAJ ED-4701/102 |
Ta=125℃ RH=85% 2 atm*1 |
100h | It is due to the electric characteristic standard. |
| 5 | Temperature Cycle | JEITA EIAJ ED-4701/105 MIL-STD-883 1010.7 |
-55℃/RT/125℃ (30min/5min/30min) |
100cycle | It is due to the electric characteristic standard. |
| 6 | Resistance to Soldering Heat | JEITA EIAJ ED-4701/301 JEITA EIAJ ED-4701/302 JIS-C0050,C0054 |
Ta=125°C RH=85% 2 atm*1 |
10sec | The malfunction on the outward appearance isn’t admitted and meets a specification electrically. |
| 7 | Solderability | JEITA EIAJ ED-4701/303 MIL-STD-883 2003.7 |
Ta=240°C | 3sec | Equal to or more than 95% of the outerlead is matted. |
| 8 | Electrostatic Discharges | JEITA EIAJ ED-4701/304 (MM) |
Capacitor charge method C=200pF R=0Ω 5 pulses applied Ta=RT Positive and negative strengths of all pins All terminal: 200V |
It is due to the electric characteristic standard. | |
| 8 | Electrostatic Discharges | MIL-STD-883 3015.7 (HBM) |
Capacitor charge method C=100pF R=1.5kΩ 3 pulses applied Ta=RT Positive and negative strengths of all pins All terminal: 2000V |
It is due to the electric characteristic standard. | |
| 9 | Latch-up | JEITA EIAJ ED-4701/306 JEDEC JESD78 |
Current input method VDD=MAX Ta=RT To VDD pin:+pulse To VSS pin:-pulse Impressed condition: Pulse width: 10msec All I/O terminal: 100mA |
It is due to the electric characteristic standard. | |
- *1Pre-condition:85°C/85% 168hrs→Infrared reflow Ta=255±5°C 10sec 2Times(only SMD)
- *2Pre-condition:85°C/85% 168hrs(only SMD)
In order to achieve quality that satisfies our customers, we show the process from planning, development, production to shipping and collaboration with each other.
Semiconductor products are easily affected by the surrounding environment, so please handle and store them with sufficient care.
Introduces the in-house analysis system and analysis examples for identifying the location of failures and cause of defects.
Process information from production, processing, inspection, and shipping of products is recorded by lot number, which makes searching and tracking possible.
Aiming to harmonize with the global environment, we are working to reduce harmful chemical substances contained in our products, including our supply chain.